Chelen Johnson
SIRXS (SEIP IR Excess Survey) : looking for IR excesses around stars found within the Spitzer Enhanced Imaging Products (SEIP) source list.
When I look at how the intellectual process changed over the last year I imagine it going from a diffuse look at research and the entire conference experience to the extreme focus on our own project during the year and finally reaching outward again in Seattle to incorporate new information and understandings. Returning to AAS made the experience complete.
I have learned that a student’s age or grade level can never be used to judge their ability to grasp the complex if they are only give the right time and instruction. They showed me that again on this trip.
Thank you for such a first class learning experience.
